Conductive particle microscopeThe HNL-100DIC conductive particle microscope is suitable for microscopic observation of the microstructure and geometric morphology of LCD conductive particles and workpiece surfaces.[Detailed] |
Differential interference microscope (observation of co…Metallographic microscope is developed for the needs of LCD, semiconductor industry, silicon wafer manufacturing industry, electronic information industry, and metallurgical industry. As an advanced metallographic microscope user, it can experience its super strong performance and be widely used in the de…[Detailed] |
Conductive particle observation microscopeThe conductive particle observation microscope is mainly used for semiconductor wafer detection, liquid crystal screen (LCD) detection, conductive particle inspection, laboratory material analysis, and other precision engineering testing fields. It can perform bright field, dark field, differential interf…[Detailed] |
